真空 ›› 2021, Vol. 58 ›› Issue (3): 30-34.doi: 10.13385/j.cnki.vacuum.2021.03.06
杨子淑, 段苹, 邓金祥, 张晓霞, 张杰, 杨倩倩
YANG Zi-shu, DUAN Ping, DENG Jin-xiang, ZHANG Xiao-xia, ZHANG Jie, YANG Qian-qian
摘要: 本文采用射频磁控溅射方法在石英和高阻硅衬底上制备纯β-Ga2O3薄膜和不同掺杂浓度的Mg掺杂β-Ga2O3薄膜,研究了薄膜的结构、光学和电学性质。X射线衍射测试结果表明,在我们的掺杂浓度内,Mg掺杂β-Ga2O3薄膜没有出现其他晶相的衍射峰,随着Mg掺杂浓度变大,薄膜的(401)和(601)衍射峰强度变弱。使用X射线光电子能谱测试薄膜中各元素的结合能和化学态。紫外-可见透射光谱测试结果表明薄膜在测试波段平均透光率高达80%以上,薄膜的带隙宽度随着Mg掺杂浓度变大而变大。霍尔效应测试结果表明我们采用射频磁控溅射方法制备的Mg掺杂β-Ga2O3薄膜的导电类型为p型,载流子浓度由3.76×1010cm-3增加到1.89×1013cm-3,说明Mg掺杂β-Ga2O3薄膜是一种很有潜力的p型半导体材料。
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