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VACUUM ›› 2020, Vol. 57 ›› Issue (3): 34-36.doi: 10.13385/j.cnki.vacuum.2020.03.08

• Thin Film • Previous Articles     Next Articles

Study on the Photoelectric Properties of N Doped CN Thin Films

SHEN Hong-xue1, LI Gang1, YAO Ting-ting1, JIN Bao-qi2, JIN Ke-wu1, WANG Tian-qi1   

  1. 1. State Key Laboratory for Advanced Technology of Float Glass, Bengbu 233018, China;
    2. AnHui University of Finance & Economics, Bengbu 233018, China
  • Received:2019-06-17 Published:2020-06-18

Abstract: Using high purity graphite as target, Ar and N2 as sputtering and reacting gases, a series of CN thin films with different N content were prepared by DC magnetron sputtering. The composition, morphology, transmittance and electrical resistivity of the films were detected by means of XRD, SEM, spectrophotometer and high impedance meter. The results show that the CN film has the first crystal shape, and with the increase of N2 content in the sputtering chamber, the content of N in the film increases first and then decreases finally to the stable state. The resistivity of the film is maintained within the range of 10-5Ω·cm to 1015Ω.cm and the transmittance is basically maintained between 85% and 91%. The incorporation of N played a stabilizing role in the sp3 hybrid C in the films.

Key words: sp3 hybrids, transmittance, resistivity, crystal type

CLC Number: 

  • TQ174
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