真空 ›› 2024, Vol. 61 ›› Issue (5): 97-109.doi: 10.13385/j.cnki.vacuum.2024.05.13
王富芳1,2, 徐子琪3, 郭冲4, 梁汉东1,2, 李展平4
WANG Fu-fang1,2, XU Zi-qi3, GUO Chong4, LIANG Han-dong1,2, LI Zhan-ping4
摘要： 矿物样品的研究是矿物学、岩石学、矿床学等地质学科的基础,矿物的表面形貌、元素组成和分布特征能够揭示成矿物质来源、成矿过程和地质历史等。本文阐述了对于矿物样品表征具有广泛应用潜力的TOF-SIMS原理、技术优势及其所需的真空条件,重点总结了国内外学者应用TOF-SIMS在矿物识别、矿物成像、矿物成分定量分析和深度剖析及矿物加工上的研究进展与存在的问题,并对相关领域进行了展望。
中图分类号: P575.9
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