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VACUUM ›› 2021, Vol. 58 ›› Issue (6): 38-42.doi: 10.13385/j.cnki.vacuum.2021.06.07

• Thin Film • Previous Articles     Next Articles

Optimization Design and Preparation of Wide Angle Incidence Near UV Reflector

SONG Guang-hui, LI Wen-long, WANG Yin-he, HU Wen-wen, YAO Chun-long, LIU Hai-tao   

  1. Shenyang Acadamy of Instrumentaion Science Co.,Ltd.,Shenyang 110041,China
  • Received:2020-07-16 Online:2021-11-25 Published:2021-11-30

Abstract: In this paper, based on the structured film system and using the film system software to optimize the design, a multilayer medium film system is designed to meet the requirements of wide angle incidence near ultraviolet reflector used in the UV system of the projection photolithography machine. Based on the planet-type rotating mechanism, the film thickness distribution within 400mm in the diameter of the plane near-ultraviolet reflector was calculated. Through the research on the film thickness uniformity correction technology, the spectral curve deviation of the film thickness on the lens surface was realized to be less than 5nm.

Key words: near UV, wideangle of incidence, film design, uniformity

CLC Number: 

  • O484
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