真空 ›› 2019, Vol. 56 ›› Issue (3): 60-65.doi: 10.13385/j.cnki.vacuum.2019.03.14
张亚平, 杨秀华, 何胤, 黄一彬, 王波, 刘湘云, 王艳, 聂喜亮
ZHANG Ya-ping, YANG Xiu-hua, HE Yin, HUANG Yi-bin, WANG Bo, WANG Yan, NIE Xi-liang
摘要： 基于高温工作型红外探测器杜瓦组件的发展趋势,对影响杜瓦漏热指标至关重要的传导漏热和辐射漏热作了分析,提出杜瓦设计改进的方法。概括了杜瓦漏热测试的常规方法,并分析其在高工作温度杜瓦漏热测试方面的缺陷。采用真空保护量热法,实现高工作温度型杜瓦组件漏热的可靠测试,推动第三代红外焦平面探测器组件的发展。
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